LXR dpdk/app/test/test_ring_mt_peek

   1/* SPDX-License-Identifier: BSD-3-Clause
   2 * Copyright(c) 2020 Intel Corporation
   3 */
   4
   5#include "test_ring_stress_impl.h"
   6#include <rte_ring_elem.h>
   7
   8static inline uint32_t
   9_st_ring_dequeue_bulk(struct rte_ring *r, void **obj, uint32_t n,
  10        uint32_t *avail)
  11{
  12        uint32_t m;
  13
  14        m = rte_ring_dequeue_bulk_start(r, obj, n, avail);
  15        n = (m == n) ? n : 0;
  16        rte_ring_dequeue_finish(r, n);
  17        return n;
  18}
  19
  20static inline uint32_t
  21_st_ring_enqueue_bulk(struct rte_ring *r, void * const *obj, uint32_t n,
  22        uint32_t *free)
  23{
  24        uint32_t m;
  25
  26        m = rte_ring_enqueue_bulk_start(r, n, free);
  27        n = (m == n) ? n : 0;
  28        rte_ring_enqueue_finish(r, obj, n);
  29        return n;
  30}
  31
  32static int
  33_st_ring_init(struct rte_ring *r, const char *name, uint32_t num)
  34{
  35        return rte_ring_init(r, name, num,
  36                RING_F_MP_HTS_ENQ | RING_F_MC_HTS_DEQ);
  37}
  38
  39const struct test test_ring_mt_peek_stress = {
  40        .name = "MT_PEEK",
  41        .nb_case = RTE_DIM(tests),
  42        .cases = tests,
  43};
  44