uboot/drivers/mtd/onenand/onenand_bbt.c
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   1/*
   2 *  linux/drivers/mtd/onenand/onenand_bbt.c
   3 *
   4 *  Bad Block Table support for the OneNAND driver
   5 *
   6 *  Copyright(c) 2005-2008 Samsung Electronics
   7 *  Kyungmin Park <kyungmin.park@samsung.com>
   8 *
   9 *  TODO:
  10 *    Split BBT core and chip specific BBT.
  11 *
  12 * This program is free software; you can redistribute it and/or modify
  13 * it under the terms of the GNU General Public License version 2 as
  14 * published by the Free Software Foundation.
  15 */
  16
  17#include <common.h>
  18#include <log.h>
  19#include <linux/compat.h>
  20#include <linux/mtd/mtd.h>
  21#include <linux/mtd/onenand.h>
  22#include <malloc.h>
  23
  24#include <linux/errno.h>
  25
  26/**
  27 * check_short_pattern - [GENERIC] check if a pattern is in the buffer
  28 * @param buf           the buffer to search
  29 * @param len           the length of buffer to search
  30 * @param paglen        the pagelength
  31 * @param td            search pattern descriptor
  32 *
  33 * Check for a pattern at the given place. Used to search bad block
  34 * tables and good / bad block identifiers. Same as check_pattern, but
  35 * no optional empty check and the pattern is expected to start
  36 * at offset 0.
  37 */
  38static int check_short_pattern(uint8_t * buf, int len, int paglen,
  39                               struct nand_bbt_descr *td)
  40{
  41        int i;
  42        uint8_t *p = buf;
  43
  44        /* Compare the pattern */
  45        for (i = 0; i < td->len; i++) {
  46                if (p[i] != td->pattern[i])
  47                        return -1;
  48        }
  49        return 0;
  50}
  51
  52/**
  53 * create_bbt - [GENERIC] Create a bad block table by scanning the device
  54 * @param mtd           MTD device structure
  55 * @param buf           temporary buffer
  56 * @param bd            descriptor for the good/bad block search pattern
  57 * @param chip          create the table for a specific chip, -1 read all chips.
  58 *              Applies only if NAND_BBT_PERCHIP option is set
  59 *
  60 * Create a bad block table by scanning the device
  61 * for the given good/bad block identify pattern
  62 */
  63static int create_bbt(struct mtd_info *mtd, uint8_t * buf,
  64                      struct nand_bbt_descr *bd, int chip)
  65{
  66        struct onenand_chip *this = mtd->priv;
  67        struct bbm_info *bbm = this->bbm;
  68        int i, j, numblocks, len, scanlen;
  69        int startblock;
  70        loff_t from;
  71        size_t readlen, ooblen;
  72        struct mtd_oob_ops ops;
  73        int rgn;
  74
  75        printk(KERN_INFO "Scanning device for bad blocks\n");
  76
  77        len = 1;
  78
  79        /* We need only read few bytes from the OOB area */
  80        scanlen = ooblen = 0;
  81        readlen = bd->len;
  82
  83        /* chip == -1 case only */
  84        /* Note that numblocks is 2 * (real numblocks) here;
  85         * see i += 2 below as it makses shifting and masking less painful
  86         */
  87        numblocks = this->chipsize >> (bbm->bbt_erase_shift - 1);
  88        startblock = 0;
  89        from = 0;
  90
  91        ops.mode = MTD_OPS_PLACE_OOB;
  92        ops.ooblen = readlen;
  93        ops.oobbuf = buf;
  94        ops.len = ops.ooboffs = ops.retlen = ops.oobretlen = 0;
  95
  96        for (i = startblock; i < numblocks;) {
  97                int ret;
  98
  99                for (j = 0; j < len; j++) {
 100                        /* No need to read pages fully,
 101                         * just read required OOB bytes */
 102                        ret = onenand_bbt_read_oob(mtd,
 103                                             from + j * mtd->writesize +
 104                                             bd->offs, &ops);
 105
 106                        /* If it is a initial bad block, just ignore it */
 107                        if (ret == ONENAND_BBT_READ_FATAL_ERROR)
 108                                return -EIO;
 109
 110                        if (ret || check_short_pattern
 111                            (&buf[j * scanlen], scanlen, mtd->writesize, bd)) {
 112                                bbm->bbt[i >> 3] |= 0x03 << (i & 0x6);
 113                                printk(KERN_WARNING
 114                                       "Bad eraseblock %d at 0x%08x\n", i >> 1,
 115                                       (unsigned int)from);
 116                                break;
 117                        }
 118                }
 119                i += 2;
 120
 121                if (FLEXONENAND(this)) {
 122                        rgn = flexonenand_region(mtd, from);
 123                        from += mtd->eraseregions[rgn].erasesize;
 124                } else
 125                        from += (1 << bbm->bbt_erase_shift);
 126        }
 127
 128        return 0;
 129}
 130
 131/**
 132 * onenand_memory_bbt - [GENERIC] create a memory based bad block table
 133 * @param mtd           MTD device structure
 134 * @param bd            descriptor for the good/bad block search pattern
 135 *
 136 * The function creates a memory based bbt by scanning the device
 137 * for manufacturer / software marked good / bad blocks
 138 */
 139static inline int onenand_memory_bbt(struct mtd_info *mtd,
 140                                     struct nand_bbt_descr *bd)
 141{
 142        unsigned char data_buf[MAX_ONENAND_PAGESIZE];
 143
 144        return create_bbt(mtd, data_buf, bd, -1);
 145}
 146
 147/**
 148 * onenand_isbad_bbt - [OneNAND Interface] Check if a block is bad
 149 * @param mtd           MTD device structure
 150 * @param offs          offset in the device
 151 * @param allowbbt      allow access to bad block table region
 152 */
 153static int onenand_isbad_bbt(struct mtd_info *mtd, loff_t offs, int allowbbt)
 154{
 155        struct onenand_chip *this = mtd->priv;
 156        struct bbm_info *bbm = this->bbm;
 157        int block;
 158        uint8_t res;
 159
 160        /* Get block number * 2 */
 161        block = (int) (onenand_block(this, offs) << 1);
 162        res = (bbm->bbt[block >> 3] >> (block & 0x06)) & 0x03;
 163
 164        pr_debug("onenand_isbad_bbt: bbt info for offs 0x%08x: (block %d) 0x%02x\n",
 165                 (unsigned int)offs, block >> 1, res);
 166
 167        switch ((int)res) {
 168        case 0x00:
 169                return 0;
 170        case 0x01:
 171                return 1;
 172        case 0x02:
 173                return allowbbt ? 0 : 1;
 174        }
 175
 176        return 1;
 177}
 178
 179/**
 180 * onenand_scan_bbt - [OneNAND Interface] scan, find, read and maybe create bad block table(s)
 181 * @param mtd           MTD device structure
 182 * @param bd            descriptor for the good/bad block search pattern
 183 *
 184 * The function checks, if a bad block table(s) is/are already
 185 * available. If not it scans the device for manufacturer
 186 * marked good / bad blocks and writes the bad block table(s) to
 187 * the selected place.
 188 *
 189 * The bad block table memory is allocated here. It must be freed
 190 * by calling the onenand_free_bbt function.
 191 *
 192 */
 193int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd)
 194{
 195        struct onenand_chip *this = mtd->priv;
 196        struct bbm_info *bbm = this->bbm;
 197        int len, ret = 0;
 198
 199        len = this->chipsize >> (this->erase_shift + 2);
 200        /* Allocate memory (2bit per block) */
 201        bbm->bbt = malloc(len);
 202        if (!bbm->bbt)
 203                return -ENOMEM;
 204        /* Clear the memory bad block table */
 205        memset(bbm->bbt, 0x00, len);
 206
 207        /* Set the bad block position */
 208        bbm->badblockpos = ONENAND_BADBLOCK_POS;
 209
 210        /* Set erase shift */
 211        bbm->bbt_erase_shift = this->erase_shift;
 212
 213        if (!bbm->isbad_bbt)
 214                bbm->isbad_bbt = onenand_isbad_bbt;
 215
 216        /* Scan the device to build a memory based bad block table */
 217        if ((ret = onenand_memory_bbt(mtd, bd))) {
 218                printk(KERN_ERR
 219                       "onenand_scan_bbt: Can't scan flash and build the RAM-based BBT\n");
 220                free(bbm->bbt);
 221                bbm->bbt = NULL;
 222        }
 223
 224        return ret;
 225}
 226
 227/*
 228 * Define some generic bad / good block scan pattern which are used
 229 * while scanning a device for factory marked good / bad blocks.
 230 */
 231static uint8_t scan_ff_pattern[] = { 0xff, 0xff };
 232
 233static struct nand_bbt_descr largepage_memorybased = {
 234        .options = 0,
 235        .offs = 0,
 236        .len = 2,
 237        .pattern = scan_ff_pattern,
 238};
 239
 240/**
 241 * onenand_default_bbt - [OneNAND Interface] Select a default bad block table for the device
 242 * @param mtd           MTD device structure
 243 *
 244 * This function selects the default bad block table
 245 * support for the device and calls the onenand_scan_bbt function
 246 */
 247int onenand_default_bbt(struct mtd_info *mtd)
 248{
 249        struct onenand_chip *this = mtd->priv;
 250        struct bbm_info *bbm;
 251
 252        this->bbm = malloc(sizeof(struct bbm_info));
 253        if (!this->bbm)
 254                return -ENOMEM;
 255
 256        bbm = this->bbm;
 257
 258        memset(bbm, 0, sizeof(struct bbm_info));
 259
 260        /* 1KB page has same configuration as 2KB page */
 261        if (!bbm->badblock_pattern)
 262                bbm->badblock_pattern = &largepage_memorybased;
 263
 264        return onenand_scan_bbt(mtd, bbm->badblock_pattern);
 265}
 266