1/* SPDX-License-Identifier: GPL-2.0+ */ 2/* 3 * linux/include/linux/mtd/bbm.h 4 * 5 * NAND family Bad Block Management (BBM) header file 6 * - Bad Block Table (BBT) implementation 7 * 8 * Copyright © 2005 Samsung Electronics 9 * Kyungmin Park <kyungmin.park@samsung.com> 10 * 11 * Copyright © 2000-2005 12 * Thomas Gleixner <tglx@linuxtronix.de> 13 * 14 */ 15#ifndef __LINUX_MTD_BBM_H 16#define __LINUX_MTD_BBM_H 17 18/** 19 * struct nand_bbt_descr - bad block table descriptor 20 * @options: options for this descriptor 21 * @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE 22 * when bbt is searched, then we store the found bbts pages here. 23 * Its an array and supports up to 8 chips now 24 * @offs: offset of the pattern in the oob area of the page 25 * @veroffs: offset of the bbt version counter in the oob are of the page 26 * @version: version read from the bbt page during scan 27 * @len: length of the pattern, if 0 no pattern check is performed 28 * @maxblocks: maximum number of blocks to search for a bbt. This number of 29 * blocks is reserved at the end of the device where the tables are 30 * written. 31 * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than 32 * bad) block in the stored bbt 33 * @pattern: pattern to identify bad block table or factory marked good / 34 * bad blocks, can be NULL, if len = 0 35 * 36 * Descriptor for the bad block table marker and the descriptor for the 37 * pattern which identifies good and bad blocks. The assumption is made 38 * that the pattern and the version count are always located in the oob area 39 * of the first block. 40 */ 41struct nand_bbt_descr { 42 int options; 43 int pages[CONFIG_SYS_NAND_MAX_CHIPS]; 44 int offs; 45 int veroffs; 46 uint8_t version[CONFIG_SYS_NAND_MAX_CHIPS]; 47 int len; 48 int maxblocks; 49 int reserved_block_code; 50 uint8_t *pattern; 51}; 52 53/* Options for the bad block table descriptors */ 54 55/* The number of bits used per block in the bbt on the device */ 56#define NAND_BBT_NRBITS_MSK 0x0000000F 57#define NAND_BBT_1BIT 0x00000001 58#define NAND_BBT_2BIT 0x00000002 59#define NAND_BBT_4BIT 0x00000004 60#define NAND_BBT_8BIT 0x00000008 61/* The bad block table is in the last good block of the device */ 62#define NAND_BBT_LASTBLOCK 0x00000010 63/* The bbt is at the given page, else we must scan for the bbt */ 64#define NAND_BBT_ABSPAGE 0x00000020 65/* bbt is stored per chip on multichip devices */ 66#define NAND_BBT_PERCHIP 0x00000080 67/* bbt has a version counter at offset veroffs */ 68#define NAND_BBT_VERSION 0x00000100 69/* Create a bbt if none exists */ 70#define NAND_BBT_CREATE 0x00000200 71/* 72 * Create an empty BBT with no vendor information. Vendor's information may be 73 * unavailable, for example, if the NAND controller has a different data and OOB 74 * layout or if this information is already purged. Must be used in conjunction 75 * with NAND_BBT_CREATE. 76 */ 77#define NAND_BBT_CREATE_EMPTY 0x00000400 78/* Write bbt if neccecary */ 79#define NAND_BBT_WRITE 0x00002000 80/* Read and write back block contents when writing bbt */ 81#define NAND_BBT_SAVECONTENT 0x00004000 82/* Search good / bad pattern on the first and the second page */ 83#define NAND_BBT_SCAN2NDPAGE 0x00008000 84/* Search good / bad pattern on the last page of the eraseblock */ 85#define NAND_BBT_SCANLASTPAGE 0x00010000 86/* 87 * Use a flash based bad block table. By default, OOB identifier is saved in 88 * OOB area. This option is passed to the default bad block table function. 89 */ 90#define NAND_BBT_USE_FLASH 0x00020000 91/* 92 * Do not store flash based bad block table marker in the OOB area; store it 93 * in-band. 94 */ 95#define NAND_BBT_NO_OOB 0x00040000 96/* 97 * Do not write new bad block markers to OOB; useful, e.g., when ECC covers 98 * entire spare area. Must be used with NAND_BBT_USE_FLASH. 99 */ 100#define NAND_BBT_NO_OOB_BBM 0x00080000 101 102/* 103 * Flag set by nand_create_default_bbt_descr(), marking that the nand_bbt_descr 104 * was allocated dynamicaly and must be freed in nand_release(). Has no meaning 105 * in nand_chip.bbt_options. 106 */ 107#define NAND_BBT_DYNAMICSTRUCT 0x80000000 108 109/* The maximum number of blocks to scan for a bbt */ 110#define NAND_BBT_SCAN_MAXBLOCKS 4 111 112/* 113 * Constants for oob configuration 114 */ 115#define NAND_SMALL_BADBLOCK_POS 5 116#define NAND_LARGE_BADBLOCK_POS 0 117#define ONENAND_BADBLOCK_POS 0 118 119/* 120 * Bad block scanning errors 121 */ 122#define ONENAND_BBT_READ_ERROR 1 123#define ONENAND_BBT_READ_ECC_ERROR 2 124#define ONENAND_BBT_READ_FATAL_ERROR 4 125 126/** 127 * struct bbm_info - [GENERIC] Bad Block Table data structure 128 * @bbt_erase_shift: [INTERN] number of address bits in a bbt entry 129 * @badblockpos: [INTERN] position of the bad block marker in the oob area 130 * @options: options for this descriptor 131 * @bbt: [INTERN] bad block table pointer 132 * @isbad_bbt: function to determine if a block is bad 133 * @badblock_pattern: [REPLACEABLE] bad block scan pattern used for 134 * initial bad block scan 135 * @priv: [OPTIONAL] pointer to private bbm date 136 */ 137struct bbm_info { 138 int bbt_erase_shift; 139 int badblockpos; 140 int options; 141 142 uint8_t *bbt; 143 144 int (*isbad_bbt)(struct mtd_info *mtd, loff_t ofs, int allowbbt); 145 146 /* TODO Add more NAND specific fileds */ 147 struct nand_bbt_descr *badblock_pattern; 148 149 void *priv; 150}; 151 152/* OneNAND BBT interface */ 153extern int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd); 154extern int onenand_default_bbt(struct mtd_info *mtd); 155 156#endif /* __LINUX_MTD_BBM_H */ 157